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Proceedings Paper

Study of LCE nanocomposites through electron microscopy
Author(s): N. Torras; J. Jobet; J. E. Marshall; K. Zinoviev; D. Yates; L. Rotkina; J. Esteve; E. M. Terentjev; E. M. Campo
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Paper Abstract

Electron microscopy was used to study previously sintered nanocomposites featuring dispersed carbon nanotubes by liquid crystal polymer dispersion and further cross-linking into liquid crystal elastomers, which resulted in a thermo-mechanical actuator. The suitability of conventional scanning electron microscopy techniques with varying coating conditions revealed the development of local charging effects, although enough latitude was granted for imaging at high vacuum modes, with differentiating contrast of the filler in the matrix. Carbon coating did contribute to charge management, although the composite might have been thermo-mechanically activated during deposition. Further, effects from focus ion beam thinning and contrast in transmission electron microscopy are discussed.

Paper Details

Date Published: 9 June 2011
PDF: 7 pages
Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 80360G (9 June 2011); doi: 10.1117/12.885539
Show Author Affiliations
N. Torras, Instituto de Microelectrónica de Barcelona (Spain)
J. Jobet, Instituto de Microelectrónica de Barcelona (Spain)
J. E. Marshall, Univ. of Cambridge (United Kingdom)
K. Zinoviev, Instituto de Microelectrónica de Barcelona (Spain)
D. Yates, Univ. of Pennsylvania (United States)
L. Rotkina, Univ. of Pennsylvania (United States)
J. Esteve, Instituto de Microelectrónica de Barcelona (Spain)
E. M. Terentjev, Univ. of Cambridge (United Kingdom)
E. M. Campo, Univ. of Pennsylvania (United States)


Published in SPIE Proceedings Vol. 8036:
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

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