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Proceedings Paper

Transmission delay measurement for converter
Author(s): Huijun Zhang; Xiaohui Li; Longxia Xu; Yanrong Xue
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Paper Abstract

This paper presents two various methods of transmission delay measurement for converter. One is group delay measurement method for multi-lever converter by means of high performance vector network analyzer. The other is envelope method used to determine the absolute delay of a converter using fast sampling scope. A scheme and key technologies of group delay measurement are described. A good measurement example is given and measurement results and their uncertainty are analyzed. It can not represent the real delay when modulation signals pass though the converter, Because the group delay curve measurement is performed by a vector network analyzer which needs the input of sweep frequency stimulation signal. Therefore, the characterization of BPSK modulation signal is analyzed. Transmission delay measurement method of BPSK modulation signal which passes though the converter is researched. Finally, the two measurement results obtained using two methods mentioned above are compared.

Paper Details

Date Published: 28 December 2010
PDF: 6 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754409 (28 December 2010); doi: 10.1117/12.885453
Show Author Affiliations
Huijun Zhang, National Time Service Ctr. (China)
Key Lab. of Precision Navigation and Timing Technology (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Xiaohui Li, National Time Service Ctr. (China)
Key Lab. of Precision Navigation and Timing Technology (China)
Longxia Xu, National Time Service Ctr. (China)
Key Lab. of Precision Navigation and Timing Technology (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Yanrong Xue, National Time Service Ctr. (China)
Key Lab. of Precision Navigation and Timing Technology (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

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