Share Email Print
cover

Proceedings Paper

3D profile measurement using heterodyne dual-frequency phase shift method
Author(s): Fengxia Duan; Naiguang Lv; Xiaoping Lou; Peng Sun
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In recent years, the reliable method to obtain absolute phase has been studied more and more widely in the field of structured light. A 3D profile measurement using heterodyne dual-frequency phase shift method is proposed in this paper. The method has three parts: phase shift, heterodyne dual-frequency and binocular stereo vision. The four-step phase shift technique is used to obtain wrapped phase map. The wrapped phase map is arctangent values between -π and π. To get the absolute phase map, wrapped phase map must be unwrapped. The traditional phase unwrapping methods, such as Gray code, produces wrong unwrapping results easily on image code boundary or break points. To solve this issue, firstly we project two spatial frequency fringes separately onto the object and obtain two wrapped phase maps by four-step phase shift technique. Secondly, by superimposing one wrapped phase map upon the other produces another phase map with a lower frequency according to heterodyne dual-frequency principle. This phase map is the absolute phase map. Finally, the binocular stereo vision accomplishes stereo matching according to the absolute phase map and 3D point reconstruction. Experimental results show that accurate and reliable phase result can be obtained on phase map boundaries and break points, which proves its feasibility in industry measurement.

Paper Details

Date Published: 31 December 2010
PDF: 8 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75444X (31 December 2010); doi: 10.1117/12.885419
Show Author Affiliations
Fengxia Duan, Beijing Information Science and Technology Univ. (China)
Naiguang Lv, Beijing Information Science and Technology Univ. (China)
Xiaoping Lou, Beijing Information Science and Technology Univ. (China)
Peng Sun, Beijing Information Science and Technology Univ. (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top