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Proceedings Paper

Motion error analysis of profilometer with grating-inductance combination
Author(s): Xuanze Wang; Ying Wu; Liangen Yang
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Paper Abstract

Common profilometers cannot be used to measure the complex surfaces with large range. A cantilever profilometer with large range and high accuracy is presented in this paper. The profilometer is composed of inductive sensors, gratings and angle measurement structure, which are used to measure surface profile, movement displacement and angle of the cantilever beam separately. The angle measured by the invariant light-distance structure based on auto-collimation principle is used to compensate the Abbe error to ensure high measurement accuracy. For counting accurately, a method of resistance chain subdivision is designed to process the grating interference fringe signal. Experiment results show that the Abbe error can be compensate through the invariant light-distance structure based on auto-collimation principle. The designed profilometer can be used to measure complex morphology.

Paper Details

Date Published: 28 December 2010
PDF: 7 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440X (28 December 2010); doi: 10.1117/12.885400
Show Author Affiliations
Xuanze Wang, HuBei Univ. of Technology (China)
HuBei Key Lab. of Manufacture Quality Engineering (China)
Ying Wu, HuBei Univ. of Technology (China)
Liangen Yang, HuBei Univ. of Technology (China)
HuBei Key Lab. of Manufacture Quality Engineering (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

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