Share Email Print

Proceedings Paper

Parameter identification of double parallel joints coordinate measuring machine
Author(s): Teng Ye; Junrui Li; Wentao Cheng; Liandong Yu; Yetai Fei
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Double Parallel Joints coordinate measuring machine (CMM) is a new type coordinate measuring device with 9 structural parameters with accuracy difficult to be ensured just by processing and assembly. Calibration is needed to identify the structural parameters of the measuring machine. This article describes the calibration process of such a Double Parallel Joints CMM, and simulation was employed to analyze how the number of samples and angle measurement accuracy influence the measurement precision and calibration result during calibrating process. The conclusions are very instructive to precision design or error allocation and calibration process of the Double Parallel Joints CMM.

Paper Details

Date Published: 28 December 2010
PDF: 7 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75445W (28 December 2010); doi: 10.1117/12.885390
Show Author Affiliations
Teng Ye, Hefei Univ. of Technology (China)
Junrui Li, Hefei Univ. of Technology (China)
Wentao Cheng, Hefei Univ. of Technology (China)
Liandong Yu, Hefei Univ. of Technology (China)
Yetai Fei, Hefei Univ. of Technology (China)

Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top