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Proceedings Paper

Distorted target recognition in cluttered scene based on maximum average correlation height algorithm
Author(s): Zhan Xue; Jiyang Shang; Wenshen Wang
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Paper Abstract

Joint Transform Correlator (JTC) is a more advanced optical pattern recognizer. Compared with computer correlation matched method, it has many advantages, such as parallel processing, high speed and more sampling points. The bottleneck technique of JTC is how to recognize the distorted targets in cluttered scene. The Maximum Average Correlation Height (MACH) algorithm applied in JTC is presented. The MACH algorithm has powerful capability of recognition for distorted targets (rotation and scale etc.). Through optimizing MACH frequency domain filter and projecting it to space domain, the MACH reference image can be obtained. This MACH reference image clearly records various distortions of a target. Based on the basic principle of JTC, the distorted targets in cluttered scene can be detected. Optical experiments with JTC show that the edge features of detected image should be extracted, the correlation calculation of MACH reference image and detected target can be performed accurately and the bright correlation peaks can be obtained. In the process of optical correlation recognition, the performance of MACH reference image is used sufficiently. The energy of correlation peaks is greatly enhanced, the cluttered scene can be suppressed effectively and the MACH reference image has high distortion tolerance. To demonstrate the feasibility of MACH reference image, the scale distorted car in cluttered scene is successfully detected.

Paper Details

Date Published: 31 December 2010
PDF: 7 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754435 (31 December 2010); doi: 10.1117/12.885347
Show Author Affiliations
Zhan Xue, Changchun Univ. of Science and Technology (China)
Jiyang Shang, Changchun Univ. of Science and Technology (China)
Wenshen Wang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

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