Share Email Print

Proceedings Paper

Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
Author(s): João Paulo Bazzo; Tiago Lukasievicz; Marcio Vogt; Valmir de Oliveira; Hypolito José Kalinowski; Jean Carlos Cardozo da Silva
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper proposes a new technique to monitor the junction temperature of an insulated gate bipolar transistor (IGBT) through direct measurement using an optical fiber sensor mounted on the chip structure. Some features of the sensor such as electromagnetic immunity, small size and fast response time allow the identification of temperature changes generated by the energy loss during device operation. In addition to the online monitoring of the junction temperature, results show the thermal characteristics of the IGBT, which can be used to develop an accurate model to simulate the heat generated during the device conduction and switching processes.

Paper Details

Date Published: 18 May 2011
PDF: 4 pages
Proc. SPIE 7753, 21st International Conference on Optical Fiber Sensors, 77538Q (18 May 2011); doi: 10.1117/12.885329
Show Author Affiliations
João Paulo Bazzo, Federal Univ. of Technology (Brazil)
Tiago Lukasievicz, Federal Univ. of Technology (Brazil)
Marcio Vogt, Federal Univ. of Technology (Brazil)
Valmir de Oliveira, Federal Univ. of Technology (Brazil)
Hypolito José Kalinowski, Federal Univ. of Technology (Brazil)
Jean Carlos Cardozo da Silva, Federal Univ. of Technology (Brazil)

Published in SPIE Proceedings Vol. 7753:
21st International Conference on Optical Fiber Sensors
Jacques Albert; Wojtek J. Bock, Editor(s)

© SPIE. Terms of Use
Back to Top