Share Email Print
cover

Proceedings Paper

Surface damage effect detection of sensor in optical lens based on cat-eye effect
Author(s): Yanzhong Zhao; Huayan Sun; Suolin Gu; Pengshan Fan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As the damage region of a sensor can be regarded as some sort of anomalistic aperture diaphragm, the reflectivity model of the sensor can be established, where the optical path of a surface damage detection system can be taken as a propagation process for a plane wave through a defocused optical lens and is reflected back to the return place. Based on the theory of angular spectrum diffraction, the diffraction transmission formulas for a plane wave through the cat-eye system can be derived by taking two-dimensional discrete Fourier transfer. The regulations on the variation of the intensity distribution of the cat-eye reflected light with different damage conditions of the sensor can then be given, and the effect of the focal shift can be analyzed. Experiment results show the intensity distribution of cat-eye reflected light has a direct relationship with the profile of the damage region and the amplificatory effect for the small damage region is of direct ratio with the focal shift. Moreover, the proposed method can be straightforwardly utilized for the surface damage effect detection of a sensor in optical lens without disconnecting it.

Paper Details

Date Published: 31 December 2010
PDF: 6 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75444O (31 December 2010); doi: 10.1117/12.885323
Show Author Affiliations
Yanzhong Zhao, Academy of Equipment Command and Technology (China)
Huayan Sun, Academy of Equipment Command and Technology (China)
Suolin Gu, China Jiu Quan Satellite Launch Ctr. (China)
Pengshan Fan, Academy of Equipment Command and Technology (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top