Share Email Print
cover

Proceedings Paper

Calibration method for large internal micrometer with three-point contact
Author(s): Rui tao Sui
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

With the development of the machinery industry and the enhancement of the components precision, the large internal micrometer with three-point contact broadens its field of application. However, the calibration method for large internal micrometer with three-point contact has not been solved completely. In order to solve all the calibration problems for large internal micrometer with three-point contact of 100mm and above, this paper proposes a new calibration method. Different from that of the calibration criterion JJF1091-2002 in Micrometer for Measuring inside Dimension, this method mainly uses the high precision CMM to calibrate the internal micrometer with three-point contact. The procedures are as follows. First, use the CMM to scan and measure the internal micrometer with three-point contact. Next, make the evaluation of scanning point with the method of the maximum circumcircle to get the CMM measurements of the internal micrometer with three-point contact in different diameter positions. Second, use the internal micrometer with three-point contact to measure any standard ring gauges within its measuring range to get the indicating value which is also named as reference point indicating value. Third, analyze the diameter value got by using the CMM to measure the internal micrometer with three-point contact in different positions and the reference point indicating value. After data processing, the error of indication in different positions can be got. Last, analyze the uncertainty of measurement to test its feasibility.

Paper Details

Date Published: 28 December 2010
PDF: 8 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754413 (28 December 2010); doi: 10.1117/12.885288
Show Author Affiliations
Rui tao Sui, Beijing Orient Institute for Measurement & Test (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top