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Proceedings Paper

Higher order harmonics contribution and suppression in metrology beamline
Author(s): Hongjun Zhou; Guanjun Wang; Jinjin Zheng; Tonglin Hou; Keqiang Qiu
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Paper Abstract

Using the house-made transmission grating (3300 l/mm) and IRDAXUV100G (USA) photodiode detector, higher order harmonics contributions have been measured in the spectral radiation standard and metrology beamline at NSRL and the contributions of the different orders have been analyzed. In order to accurately calibrate the performance of optical elements, higher order harmonics must be efficiently suppressed. Selecting the suitable filter in different wavelength, the higher order contributions can be efficiently suppressed. In wavelength region between 5 nm and 12 nm with proper Zr filters, the contributions of higher order intensity are less than 1.25%, after modified by quantum efficiency of the detector , the higher order contributions are restricted to less than 0.62 %. In wavelength region between 13 and 17 nm with Si filter, the higher order contributions are almost zero. In wavelength region between 18 nm and 34 nm with proper Al filter, the contributions of higher order intensity are less than 8.06%, after modified by quantum efficiency of the detector, the higher order contributions are restricted to less than 3.08 %.In wavelength region between 35 and 40nm with Al/Mg/Al filter, the higher order contributions are restricted to less than 10.00 % after modified by quantum efficiency of the detector.

Paper Details

Date Published: 28 December 2010
PDF: 6 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754405 (28 December 2010); doi: 10.1117/12.885285
Show Author Affiliations
Hongjun Zhou, Univ. of Science and Technology of China (China)
Guanjun Wang, Univ. of Science and Technology of China (China)
Jinjin Zheng, Univ. of Science and Technology of China (China)
Tonglin Hou, Univ. of Science and Technology of China (China)
Keqiang Qiu, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

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