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Proceedings Paper

The retardation measurement of multiple-order wave plates using white-light Michelson interferometer
Author(s): Jun Wang; Lei Chen; Bo Li; Lili Shi; Ting Luo
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Paper Abstract

A method based on white-light Michelson interferometer for measuring the retardation of multiple-order wave plates is presented. The linear polarized white-light splits into o-beam and e-beam by the test multiple-order wave plate which introduces retardation between the two beams, and then they are divided by a beam splitter and reflected by two plane mirrors in the Michelson interferometer respectively. Finally three white-light interference packets are formed. According to the optical path between the center packet and one of the side packets, the retardation can be obtained. The retardation of a multiple-order wave plate is measured in the experiment, whose result (2990.6nm) coincides with the one obtained by spectroscopic method (2992.8nm).

Paper Details

Date Published: 28 December 2010
PDF: 10 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441S (28 December 2010); doi: 10.1117/12.885193
Show Author Affiliations
Jun Wang, Nanjing Univ. of Science and Technology (China)
Lei Chen, Nanjing Univ. of Science and Technology (China)
Bo Li, Nanjing Univ. of Science and Technology (China)
Lili Shi, Nanjing Univ. of Science and Technology (China)
Ting Luo, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

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