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Proceedings Paper

Dual-probe simultaneous measurements of refractive index and thickness with spectral-domain low coherence interferometry
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Paper Abstract

An optical interferometric system for the simultaneous measurements of physical thickness and refractive group index is implemented. The proposed system is based on a spectral-domain optical low coherence interferometry with two sample probes facing to each other. The two-probe approach enables simultaneous measurements of thickness and group index of a transparent sample. The average measurement errors were ~0.112 % in the physical thickness and ~0.035 % in the group index, respectively.

Paper Details

Date Published: 17 May 2011
PDF: 4 pages
Proc. SPIE 7753, 21st International Conference on Optical Fiber Sensors, 77531N (17 May 2011); doi: 10.1117/12.885173
Show Author Affiliations
Seong Jun Park, Gwangju Institute of Science and Technology (Korea, Republic of)
Kwan Seob park, Gwangju Institute of Science and Technology (Korea, Republic of)
Young Ho Kim, Gwangju Institute of Science and Technology (Korea, Republic of)
Se-Jong Baik, Chonnam National Univ. (Korea, Republic of)
Byeong Ha Lee, Gwangju Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 7753:
21st International Conference on Optical Fiber Sensors
Jacques Albert; Wojtek J. Bock, Editor(s)

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