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Proceedings Paper

Characterization and source identification of fugitive dusts by light and electron microscopy
Author(s): Richard S. Brown
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Paper Abstract

Industrial emissions are characteristic of the manufacturing process that produced them. The storage, production and transportation of raw materials, finished product and byproducts create particles that can be characterized using a combination of light and electron microscopy. Complex mixtures of dust that settle on surfaces and individuals inside and outside of a manufacturing facility provide particles that can be compared directly to reference materials from suspected sources. Characterization of settled dusts can also guide an investigation by suggesting potential sources of the particulate comprising the dust.

Paper Details

Date Published: 8 June 2011
PDF: 17 pages
Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803607 (8 June 2011); doi: 10.1117/12.885022
Show Author Affiliations
Richard S. Brown, MVA Scientific Consultants (United States)


Published in SPIE Proceedings Vol. 8036:
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

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