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Proceedings Paper

Research on testing field flaws of image intensifier based on spatio-temporal SNR
Author(s): Bin Zhou; Bingqi Liu; Dongsheng Wu
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Paper Abstract

Image intensifier is the kernel of low-light-level device. The field flaw is one of the important index parameters of the image intensifier. Traditionally the statistic number of the image intensifier's field flaws is calculated through the people's eyes by the aid of an optical microscope, which main limitation is subjective and inefficient. With the broad application of the high-powered CCD and digital imaging processing method in testing performance of image intensifier, the method of appraising SNR based on spatio-temporal noise theory can accurately reflect the spatio-temporal heterogeneous of fluorescence's output image and fulfill the requirements of digital and automatic test. The limitation of the flaws' shape and position can be disregard and the accurate flaws' inspection can be realized rapidly by this method. In this paper, the main factors of forming the field flaws are analyzed and the mathematic model of spatio-temporal SNR is deduced. The hardware devices of the test system for image intensifier's spatio-temporal SNR are discussed. The spatio-temporal SNR of Gen image intensifier is tested by this test system and the test software based on Visual C++ and Matlab. The digital and automatic test of a factitious field flaw is realized by the theory of spatio-temporal SNR. The test precision can achieve pixel level. The experimental results show that this new method is rational, reliable and visualized.

Paper Details

Date Published: 28 October 2010
PDF: 5 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765833 (28 October 2010); doi: 10.1117/12.884870
Show Author Affiliations
Bin Zhou, Mechanical Engineering College (China)
Bingqi Liu, Mechanical Engineering College (China)
Dongsheng Wu, Mechanical Engineering College (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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