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Proceedings Paper

Micro- and nano-electronic technologies and their qualification methodology for space applications under harsh environments
Author(s): Yuan Chen; Carissa Tudryn Weber; Mohammad Mojarradi; Elizabeth Kolawa
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Paper Abstract

This paper gives a brief overview of the micro- and nano-electronic technologies for space applications under harsh environments, i.e. for operating temperatures beyond the range of -55°C to 125°C, and with exposure to radiation, pressure, shock, etc. The paper also addresses the technology reliability, the challenges and the qualification approaches for the harsh environment applications with a case study. The case study highlights the design-for-reliability approach and space qualification methodology developed to successfully design, fabricate, qualify, and infuse a motor drive electronics assembly with micro- and nano-electronics and packaging technology into a flight mission, which requires an operational temperature range over -128°C to +85°C.

Paper Details

Date Published: 13 May 2011
PDF: 16 pages
Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 80311Y (13 May 2011); doi: 10.1117/12.884680
Show Author Affiliations
Yuan Chen, NASA Langley Research Ctr. (United States)
Carissa Tudryn Weber, NASA Ames Research Ctr. (United States)
Mohammad Mojarradi, Jet Propulsion Lab. (United States)
Elizabeth Kolawa, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 8031:
Micro- and Nanotechnology Sensors, Systems, and Applications III
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)

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