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Proceedings Paper

A technique to measure afterpulse probabilities in InGaAs SPADs at nanosecond time scales with sub-picoCoulomb avalanche charge
Author(s): Alessandro Restelli; Joshua C. Bienfang; Alan L. Migdall
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Paper Abstract

We adapt a previously-demonstrated gating technique for InGaAs SPADs to enable double-bias-pulse measurements of afterpulsing at nanosecond time scales with gate durations down to 500 ps. We present preliminary results for afterpulse probabilities below 10 ns, time scales comparable to those in the self-differencing technique, and show that afterpulse probabilities low enough to support reliable counting above 100 MHz can be observed.

Paper Details

Date Published: 13 May 2011
PDF: 7 pages
Proc. SPIE 8033, Advanced Photon Counting Techniques V, 80330I (13 May 2011); doi: 10.1117/12.884529
Show Author Affiliations
Alessandro Restelli, National Institute of Standards and Technology (United States)
Joint Quantum Institute (United States)
Joshua C. Bienfang, National Institute of Standards and Technology (United States)
Joint Quantum Institute (United States)
Alan L. Migdall, National Institute of Standards and Technology (United States)
Joint Quantum Institute (United States)


Published in SPIE Proceedings Vol. 8033:
Advanced Photon Counting Techniques V
Mark A. Itzler; Joe C. Campbell, Editor(s)

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