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Proceedings Paper

Development of a fieldable rugged TATP surface-enhanced Raman spectroscopy sensor
Author(s): Kevin M. Spencer; Susan L. Clauson; James M. Sylvia
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Paper Abstract

Surface-enhanced Raman spectroscopy (SERS) has repeatedly been shown to be capable of single molecule detection in laboratory controlled environments. However, superior detection of desired compounds in complex situations requires optimization of factors in addition to sensitivity. For example, SERS sensors are metals with surface roughness in the nm scale. This metallic roughness scale may not adsorb the analyte of interest but instead cause a catalytic reaction unless stabilization is designed into the sensor interface. In addition, the SERS sensor needs to be engineered sensitive only to the desired analyte(s) or a small subset of analytes; detection of every analyte would saturate the sensor and make data interpretation untenable. Finally, the SERS sensor has to be a preferable adsorption site in passive sampling applications, whether vapor or liquid. In this paper, EIC Laboratories will discuss modifications to SERS sensors that increase the likelihood of detection of the analyte of interest. We will then demonstrate data collected for TATP, a compound that rapidly decomposes and is undetected on standard silver SERS sensors. With the modified SERS sensor, ROC curves for room temperature TATP vapor detection, detection of TATP in a non equilibrium vapor environment in 30 s, detection of TATP on a sensor exposed to a ventilation duct, and detection of TATP in the presence of fuel components were all created and will be presented herein.

Paper Details

Date Published: 12 May 2011
PDF: 9 pages
Proc. SPIE 8032, Next-Generation Spectroscopic Technologies IV, 80320L (12 May 2011); doi: 10.1117/12.884044
Show Author Affiliations
Kevin M. Spencer, EIC Labs., Inc. (United States)
Susan L. Clauson, EIC Labs., Inc. (United States)
James M. Sylvia, EIC Labs., Inc. (United States)


Published in SPIE Proceedings Vol. 8032:
Next-Generation Spectroscopic Technologies IV
Mark A. Druy; Richard A. Crocombe, Editor(s)

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