Share Email Print
cover

Proceedings Paper

Fast MTF and aberrations analysis of MWIR and LWIR imaging systems using quadri wave interferometry
Author(s): Sabrina Velghe; Emeline Durand; Djamel Brahmi; William Boucher; Benoit Wattellier
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique, to characterize optical beams at infrared wavelengths from 2 to 16μm with a single instrument. We apply this technique to qualify optical systems dedicated to MWIR (λ within 3 and 5μm) and LWIR (λ within 8 and 14μm) wavelength ranges. The QWLSI offers the crucial advantage that it yields an analyzed wave front without the use of a reference arm and consequent time consuming alignment. The qualification of an optical system with QWLSI gives a complete diagnostic, from the aberration cartography to the PSF and MTF curves for every direction in one single measurement. In this paper, we first present the QWLSI technology and its main features, we also detail an experimental comparison between our MTF measurement and the results given by a classical MTF test bench. We finally show the experimental analysis of an infrared lens at two different wavelengths, one in the MWIR range (λ=3.39μm) and the other in the LWIR range (λ=10.6μm).

Paper Details

Date Published: 9 May 2011
PDF: 8 pages
Proc. SPIE 8014, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII, 80141A (9 May 2011); doi: 10.1117/12.883967
Show Author Affiliations
Sabrina Velghe, PHASICS S.A. (France)
Emeline Durand, PHASICS S.A. (France)
Djamel Brahmi, PHASICS S.A. (France)
William Boucher, PHASICS S.A. (France)
Benoit Wattellier, PHASICS S.A. (France)


Published in SPIE Proceedings Vol. 8014:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII
Gerald C. Holst; Keith A. Krapels, Editor(s)

© SPIE. Terms of Use
Back to Top