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Proceedings Paper

Design of ROIC based on switched capacitor TDI for MCT LWIR focal plane arrays
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Paper Abstract

Design and measurement of a silicon readout integrated circuit (ROIC) based on switched capacitor time delay integration (TDI) technique for LWIR HgCdTe Focal Plane is presented. ROIC incorporates time delay integration (TDI) functionality for scanning type of detector by using switched capacitor technique with a supersampling rate of three, increasing SNR and the spatial resolution. ROIC, in terms of functionality, is capable of bidirectional scan, programmable integration time, 5 gain settings at the input and auto gain adjustment with pixel deselection capability. Programming can be done parallel or serially with test mode functionality. ROIC can handle up to 3.75V dynamic range with the load being 25pF capacitive, output settling time is less than 80 nsec. This low power ROIC consumes less than 100mW. Moreover, input referred noise is less than 750 rms electrons. Simulations and measurements are done in both room temperature and cryogenic (77 °K) temperatures. In order to measure and simulate chip without a detector, process and temperature invariant current source block that imitate detector currents are designed as well. The manufacturing technology is 0.35μm, double poly-Si, four-metal (3 metals and 1 top metal) 5V CMOS process.

Paper Details

Date Published: 20 May 2011
PDF: 11 pages
Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80120M (20 May 2011); doi: 10.1117/12.883951
Show Author Affiliations
Huseyin Kayahan, Sabanci Univ. (Turkey)
Melik Yazici, Sabanci Univ. (Turkey)
Omer Ceylan, Sabanci Univ. (Turkey)
Muhammet Burak Baran, Sabanci Univ. (Turkey)
Yasar Gurbuz, Sabanci Univ. (Turkey)

Published in SPIE Proceedings Vol. 8012:
Infrared Technology and Applications XXXVII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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