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Proceedings Paper

Advances in freeform optical metrology using a multibeam low-coherence optical probe (Quad-Probe)
Author(s): Christopher J. Ditchman; Damon W. Diehl; Christopher T. Cotton; Nathan E. Burdick; David Woodlock; Jun Zou
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Paper Abstract

Conformal windows reduce drag, but introduce optical aberrations. Corrector optics minimize such optical aberrations, but they feature complex surfaces that cannot presently be measured interferometrically. To address this problem, ASE Optics has developed a non-contact "Quad-Probe" that measure the position and orientation of surfaces. By scanning the probe over the surface of the optic, a 3D model of the interior and exterior surfaces can be built. Furthermore, the Quad-Probe can be used inside a polishing machine, and feedback from the Quad-Probe can be used to guide the scanner in measuring an unknown part.

Paper Details

Date Published: 21 May 2011
PDF: 13 pages
Proc. SPIE 8016, Window and Dome Technologies and Materials XII, 80160V (21 May 2011); doi: 10.1117/12.883933
Show Author Affiliations
Christopher J. Ditchman, ASE Optics LLC (United States)
Damon W. Diehl, ASE Optics LLC (United States)
Christopher T. Cotton, ASE Optics LLC (United States)
Nathan E. Burdick, ASE Optics LLC (United States)
David Woodlock, ASE Optics LLC (United States)
Jun Zou, ASE Optics LLC (United States)


Published in SPIE Proceedings Vol. 8016:
Window and Dome Technologies and Materials XII
Randal W. Tustison, Editor(s)

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