Share Email Print

Proceedings Paper

Visceral fat estimation method by bioelectrical impedance analysis and causal analysis
Author(s): Hiroshi Nakajima; Hiroshi Tasaki; Naoki Tsuchiya; Takehiro Hamaguchi; Toshikazu Shiga
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

It has been clarified that abdominal visceral fat accumulation is closely associated to the lifestyle disease and metabolic syndrome. The gold standard in medical fields is visceral fat area measured by an X-ray computer tomography (CT) scan or magnetic resonance imaging. However, their measurements are high invasive and high cost; especially a CT scan causes X-ray exposure. They are the reasons why medical fields need an instrument for viscera fat measurement with low invasive, ease of use, and low cost. The article proposes a simple and practical method of visceral fat estimation by employing bioelectrical impedance analysis and causal analysis. In the method, abdominal shape and dual impedances of abdominal surface and body total are measured to estimate a visceral fat area based on the cause-effect structure. The structure is designed according to the nature of abdominal body composition to be fine-tuned by statistical analysis. The experiments were conducted to investigate the proposed model. 180 subjects were hired to be measured by both a CT scan and the proposed method. The acquired model explained the measurement principle well and the correlation coefficient is 0.88 with the CT scan measurements.

Paper Details

Date Published: 3 June 2011
PDF: 8 pages
Proc. SPIE 8058, Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX, 80580Z (3 June 2011); doi: 10.1117/12.883722
Show Author Affiliations
Hiroshi Nakajima, OMRON Corp. (Japan)
Hiroshi Tasaki, OMRON Corp. (Japan)
Naoki Tsuchiya, OMRON Corp. (Japan)
Takehiro Hamaguchi, OMRON Healthcare Co., Ltd. (Japan)
Toshikazu Shiga, OMRON Healthcare Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 8058:
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX
Harold Szu, Editor(s)

© SPIE. Terms of Use
Back to Top