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Proceedings Paper

IR emitter non-uniformity correction (NUC): making sense of the data
Author(s): Jim Oleson; Derek Greer
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Paper Abstract

Several organizations in the government and industry are actively developing IR emitter array nonuniformity correction (NUC) algorithms. While significant effort has been expended and progress has been made, there are no standard and comprehensive metrics for describing post NUC emitter nonuniformity. Subsequently, the nonuniformity data reported by one organization may not be comparable with data from another. Further, the sigma/mean uniformity values typically reported do not shed light on fixed pattern noise such as row and column offsets. As a result, NUC reporting often does not give a customer adequate insight into the value of emitter nonuniformity correction. This paper offers standard metrics for measuring and reporting IR emitter array nonuniformity. The metrics established here allow data from one measuring organization to be directly compared with that of another. Further, more practical aspects of nonuniformity correction are addressed which shed light on issues such as fixed pattern noise (FPN), emission gradients and other undesirable artifacts. Data analysis techniques described in this paper demonstrate the new metrics and their descriptive role in the NUC process. The NUC parameters established here characterize the ability of IR emitter arrays to accurately represent terrestrial scenes as well as hot objects and gases. This paper also explores areas in the emitter dynamic range that provide special challenges for generating a NUC table and their influence in the selection of nonuniformity correction radiance levels.

Paper Details

Date Published: 9 May 2011
PDF: 11 pages
Proc. SPIE 8015, Technologies for Synthetic Environments: Hardware-in-the-Loop XVI, 801502 (9 May 2011); doi: 10.1117/12.883450
Show Author Affiliations
Jim Oleson, Oleson Convergent Solutions LLC (United States)
Derek Greer, Naval Air Warfare Ctr. Aircraft Div. (United States)

Published in SPIE Proceedings Vol. 8015:
Technologies for Synthetic Environments: Hardware-in-the-Loop XVI
Scott B. Mobley, Editor(s)

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