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Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software
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Paper Abstract

Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.

Paper Details

Date Published: 20 May 2011
PDF: 15 pages
Proc. SPIE 8016, Window and Dome Technologies and Materials XII, 80160U (20 May 2011); doi: 10.1117/12.883422
Show Author Affiliations
Ian B. Murray, Exotic Electro-Optics, Inc. (United States)
Victor Densmore, The Univ. of Arizona (United States)
Vaibhav Bora, The Univ. of Arizona (United States)
Matthew W. Pieratt, Exotic Electro-Optics, Inc. (United States)
Douglas L. Hibbard, Exotic Electro-Optics, Inc. (United States)
Tom D. Milster, The Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 8016:
Window and Dome Technologies and Materials XII
Randal W. Tustison, Editor(s)

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