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Proceedings Paper

Calibration and deployment of a new NIST transfer radiometer for broadband and spectral calibration of space chambers (MDXR)
Author(s): Timothy M. Jung; Adriaan C. Carter; Solomon I. Woods; Simon G. Kaplan
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Paper Abstract

The Low-Background Infrared (LBIR) facility at NIST has performed on-site calibration and initial off-site deployments of a new infrared transfer radiometer with an integrated cryogenic Fourier transform spectrometer (Cryo- FTS). This mobile radiometer can be deployed to customer sites for broadband and spectral calibrations of space chambers and low-background hardware-in-the-loop testbeds. The Missile Defense Transfer Radiometer (MDXR) has many of the capabilities of a complete IR calibration facility and replaces our existing filter-based transfer radiometer (BXR) as the NIST standard detector deployed to customer facilities. The MDXR features numerous improvements over the BXR, including: a cryogenic Fourier transform spectrometer, an on-board absolute cryogenic radiometer (ACR) and an internal blackbody reference source with an integrated collimator. The Cryo-FTS can be used to measure high resolution spectra from 3 to 28 micrometers, using a Si:As blocked-impurity-band (BIB) detector. The on-board ACR can be used for self-calibration of the MDXR BIB as well as for absolute measurements of external infrared sources. A set of filter wheels and a rotating polarizer within the MDXR allow for filter-based and polarization-sensitive measurements. The optical design of the MDXR makes both radiance and irradiance measurements possible and enables calibration of both divergent and collimated sources. Results of on-site calibration of the MDXR using its internal blackbody source and an external reference source will be discussed, as well as the performance of the new radiometer in its initial deployments to customer sites.

Paper Details

Date Published: 13 May 2011
PDF: 11 pages
Proc. SPIE 8015, Technologies for Synthetic Environments: Hardware-in-the-Loop XVI, 80150C (13 May 2011); doi: 10.1117/12.883415
Show Author Affiliations
Timothy M. Jung, Jung Research and Development Corp. (United States)
Adriaan C. Carter, Booz Allen Hamilton Inc. (United States)
Solomon I. Woods, National Institute of Standards and Technology (United States)
Simon G. Kaplan, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 8015:
Technologies for Synthetic Environments: Hardware-in-the-Loop XVI
Scott B. Mobley, Editor(s)

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