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Proceedings Paper

Dispersion free all reflective confocal microscope objective
Author(s): Wojtek J. Walecki; Mike Scaggs; Peter S Walecki; Fanny Szondy
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Paper Abstract

A large numerical aperture (NA in range 0.65-0.8), diffraction limited, broadband (100 nm - 30,000 nm), all-reflective confocal microscope objective design is discussed. The design is compatible with engineered polarization state of the excitation beam further decreasing focus spot size. Unlike in the other designs in the proposed system measured sample does not obscure final reflector. The proposed objective extends spatial and temporal limits of existing novel optical microscope techniques such as confocal microscopy described, multi-photon microscopy, 4Pi microscopy, I5M microscopy and others. All reflective design gives promise for high power and high resolution laser-machining applications.

Paper Details

Date Published: 1 June 2011
PDF: 8 pages
Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803612 (1 June 2011); doi: 10.1117/12.883385
Show Author Affiliations
Wojtek J. Walecki, Sunrise Optical LLC (United States)
Mike Scaggs, Neoteric Concepts, LLC (United States)
Peter S Walecki, Sunrise Optical LLC (United States)
Fanny Szondy, Sunrise Optical LLC (United States)


Published in SPIE Proceedings Vol. 8036:
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

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