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Proceedings Paper

A fuzzy automated object classification by infrared laser camera
Author(s): Seigo Kanazawa; Kazuhiko Taniguchi; Kazunari Asari; Kei Kuramoto; Syoji Kobashi; Yutaka Hata
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Paper Abstract

Home security in night is very important, and the system that watches a person's movements is useful in the security. This paper describes a classification system of adult, child and the other object from distance distribution measured by an infrared laser camera. This camera radiates near infrared waves and receives reflected ones. Then, it converts the time of flight into distance distribution. Our method consists of 4 steps. First, we do background subtraction and noise rejection in the distance distribution. Second, we do fuzzy clustering in the distance distribution, and form several clusters. Third, we extract features such as the height, thickness, aspect ratio, area ratio of the cluster. Then, we make fuzzy if-then rules from knowledge of adult, child and the other object so as to classify the cluster to one of adult, child and the other object. Here, we made the fuzzy membership function with respect to each features. Finally, we classify the clusters to one with the highest fuzzy degree among adult, child and the other object. In our experiment, we set up the camera in room and tested three cases. The method successfully classified them in real time processing.

Paper Details

Date Published: 4 June 2011
PDF: 9 pages
Proc. SPIE 8058, Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX, 805815 (4 June 2011); doi: 10.1117/12.883362
Show Author Affiliations
Seigo Kanazawa, Univ. of Hyogo (Japan)
Kazuhiko Taniguchi, Kinden Corp. (Japan)
Kazunari Asari, Kansai Electric Power Co., Inc. (Japan)
Kei Kuramoto, Univ. of Hyogo (Japan)
Osaka Univ. (Japan)
Syoji Kobashi, Univ. of Hyogo (Japan)
Osaka Univ. (Japan)
Yutaka Hata, Univ. of Hyogo (Japan)
Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 8058:
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX
Harold Szu, Editor(s)

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