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Proceedings Paper

Digital 640x512 / 15μm InSb detector for high frame rate, high sensitivity, and low power applications
Author(s): T. Markovitz; I. Pivnik; Z. Calahorra; E. Ilan; I. Hirsh; E. Zeierman; M. Eylon; E. Kahanov; I. Kogan; N. Fishler; M. Brumer; I. Lukomsky
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Paper Abstract

Pelican-D is a new digital 640x512 / 15μm InSb detector developed by SCD to serve a number of applications. The Readout Integrated Circuit (ROIC) has a digital output which can be calibrated to a signal resolution in the 13-15 bit range. Besides the digital output, the detector has some additional advantages over other MWIR detectors of the same format. The high frequency of data output, which supports a full image frame rate of over 300Hz, is very useful in systems that track fast evolving events such as Missile Warning Systems (MWS), Missile Seekers and some Thermographic applications. Another important characteristic of the detector is related to an operation mode with relatively low readout noise. This mode of operation is especially beneficial in applications where the background radiation is low such as in long range surveillance systems. For imaging systems where very high sensitivity is required, the ROIC can be coupled to an epi-InSb detector array and have a dark current at 77K that is lower by a factor of 15 with respect to standard InSb. Alternatively, Pelican-D with epi-InSb can be operated at 95K with a standard dark current and sensitivity. Such an elevated operating temperature enables the use of cryogenic coolers of relatively low size, weight and power for applications such as Hand-held cameras, miniature gimbaled systems, and light UAVs. In this work we present in detail the characteristic performance of the new detector and its applications.

Paper Details

Date Published: 20 May 2011
PDF: 10 pages
Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80122Y (20 May 2011); doi: 10.1117/12.883345
Show Author Affiliations
T. Markovitz, SCD Semiconductor Devices (Israel)
I. Pivnik, SCD Semiconductor Devices (Israel)
Z. Calahorra, SCD Semiconductor Devices (Israel)
E. Ilan, SCD Semiconductor Devices (Israel)
I. Hirsh, SCD Semiconductor Devices (Israel)
E. Zeierman, SCD Semiconductor Devices (Israel)
M. Eylon, SCD Semiconductor Devices (Israel)
E. Kahanov, SCD Semiconductor Devices (Israel)
I. Kogan, SCD Semiconductor Devices (Israel)
N. Fishler, SCD Semiconductor Devices (Israel)
M. Brumer, SCD Semiconductor Devices (Israel)
I. Lukomsky, SCD Semiconductor Devices (Israel)


Published in SPIE Proceedings Vol. 8012:
Infrared Technology and Applications XXXVII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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