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Proceedings Paper

Toward a single-chip TECless/NUCless InGaAs SWIR camera with 120-dB intrinsic operation dynamic range
Author(s): Y. Ni; B. Arion; Y. M. Zhu; P. Potet; Odile Huet; Jean Luc Reverchon; Jean Patrick Truffer; Jean Alexandre Robo; Eric Costard
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Paper Abstract

This paper describes a single-chip InGaAs SWIR camera with more than 120dB instant operational dynamic range with an innovative CMOS ROIC technology, so called MAGIC, invented and patented by New Imaging Technologies. A 320x256- pixel InGaAs 25μm pitch photodiode array, designed and fabricated by III-Vlab/Thales Research & Technology(TRT), has been hybridized on this new generation CMOS ROIC. With NIT's MAGIC technology, the sensor's output follows a precise logarithmic law in function of incoming photon flux and gives instant operational dynamic range (DR) better than 120 dB. The ROIC incorporates the entire video signal processing function including a CCIR TV encoder, so a complete SWIR InGaAs camera with standard video output has been realized on a single 30x30 mm2 PCB board with ¼ W power consumption. Neither TEC nor NUC is needed from room temperature operation. The camera can be switched on and off instantly, ideal for all the portable battery operated SWIR band observation applications. The measured RMS noise and FPN noise on the prototype sensor in dark conditions are 0.4 mV and 0.27 mV respectively. The signal excursion from pixel is about 300mV over the 120 dB dynamic range. The FPN remains almost constant over the whole operation dynamic range. The NEI has been measured to be 3,71E+09 ph/s/cm2 with 92 equivalent noise photons at 25Hz frame rate, better than the same architecture of InGaAs photodiode array hybridized on an Indigo ROIC ISC9809 with a pitch of 30 μm for which a readout noise of 120 electrons is observed.

Paper Details

Date Published: 20 May 2011
PDF: 12 pages
Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80121W (20 May 2011); doi: 10.1117/12.883344
Show Author Affiliations
Y. Ni, New Imaging Technologies SAS (France)
B. Arion, New Imaging Technologies SAS (France)
Y. M. Zhu, New Imaging Technologies SAS (France)
P. Potet, New Imaging Technologies SAS (France)
Odile Huet, Alcatel-Thales III-V Lab., Thales Research & Technology (France)
Jean Luc Reverchon, Alcatel-Thales III-V Lab., Thales Research & Technology (France)
Jean Patrick Truffer, Alcatel-Thales III-V Lab., Thales Research & Technology (France)
Jean Alexandre Robo, Alcatel-Thales III-V Lab., Thales Research & Technology (France)
Eric Costard, Alcatel-Thales III-V Lab., Thales Research & Technology (France)

Published in SPIE Proceedings Vol. 8012:
Infrared Technology and Applications XXXVII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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