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Proceedings Paper

Advanced multi-function infrared detector with on-chip processing
Author(s): Lidia Langof; Dan Nussinson; Elad Ilan; Shimon Elkind; Roman Dobromislin; Itzik Nevo; Fanny Khinich; Michael Labilov; Zipora Calahorra; Shay Vaserman; Tuvy Markovitz; Ofer Manela; David Elooz; Avi Tuito; Dov Oster
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Paper Abstract

Modern electro-optical systems contain several components such as thermal imager, laser designator, laser range finder, etc. The demand for compact systems with low power consumption and low cost can be addressed by incorporating some of the traditional system abilities into the IR detector. We present SNIR, a new type of detector, which consists of a Read Out Integrated Circuit (ROIC) with advanced on-chip signal processing. The ROIC is flip chip-bonded to a 640x512 InSb detector array of 15μm pitch. SNIR digital ROIC can be operated in either one of the following four different modes of operation. The first operation mode is standard thermal imaging, which has typical functionalities and performance of MWIR detector. The second operation mode is a dual-function mode that includes both standard thermal imaging and information on Asynchronous Laser Pulse Detection (ALPD) for each pixel. The detection probability of a laser pulse is significantly increased by integrating a dedicated in-pixel circuit for identifying a fast signal temporal profile. Since each pixel has internal processing to identify laser pulses, it is possible also to measure the elapsed time between a trigger and the detection of a laser pulse. This yields a third mode of operation in which the detector is synchronized to a laser and becomes a Two-dimensional Laser Range Finder (TLRF). The forth operation mode is dedicated to Low Noise Imaging (LNIM) for the SWIR band, where the IR radiation signal is low. It can be used in both passive or active imaging. We review some of the predicted and measured results for the different modes of operation, both at the detector level and at the system level.

Paper Details

Date Published: 20 May 2011
PDF: 13 pages
Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80120F (20 May 2011); doi: 10.1117/12.883248
Show Author Affiliations
Lidia Langof, SCD Semiconductor Devices (Israel)
Dan Nussinson, SCD Semiconductor Devices (Israel)
Elad Ilan, SCD Semiconductor Devices (Israel)
Shimon Elkind, SCD Semiconductor Devices (Israel)
Roman Dobromislin, SCD Semiconductor Devices (Israel)
Itzik Nevo, SCD Semiconductor Devices (Israel)
Fanny Khinich, SCD Semiconductor Devices (Israel)
Michael Labilov, SCD Semiconductor Devices (Israel)
Zipora Calahorra, SCD Semiconductor Devices (Israel)
Shay Vaserman, SCD Semiconductor Devices (Israel)
Tuvy Markovitz, SCD Semiconductor Devices (Israel)
Ofer Manela, Elbit Systems Electro-Optics El-Op Ltd. (Israel)
David Elooz, Elbit Systems Electro-Optics El-Op Ltd. (Israel)
Avi Tuito, Israeli Ministry of Defence (Israel)
Dov Oster, Israeli Ministry of Defence (Israel)

Published in SPIE Proceedings Vol. 8012:
Infrared Technology and Applications XXXVII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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