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Proceedings Paper

Nanodispersion, nonlinear image filtering, and materials classification
Author(s): Giovanni F. Crosta; Jun S. Lee
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Paper Abstract

Polyethylene terephthalate-alumina nano-composites from two production processes gave rise to materials H and T, further divided into four and, respectively, three classes of belonging. Electron microscope images of the materials had been visually scored by an expert in terms of an index, β, aimed at assessing filler dispersion and distribution. These properties characterize the nano-composite. Herewith a classification algorithm which includes image spatial differentiation and non-linear filtering interlaced with multivariate statistics is applied to the same images of materials Hand T. The classification algorithm depends on a few parameters, which are automatically determined by maximizing a figure of merit in the supervised training stage. The classifier output is a display on the plane of the first two principal components. By regressing the 1st principal component affinely against β a remarkable agreement is found between automated classification and visual scoring of material H. The regression result for materialT is not significant, because the assigned classes reduce from 3 to 2, both by visual and automated scoring. The output from the non-linear image filter can be related to filler dispersion and distribution.

Paper Details

Date Published: 7 June 2011
PDF: 10 pages
Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 80360I (7 June 2011); doi: 10.1117/12.883232
Show Author Affiliations
Giovanni F. Crosta, Univ. degli Studi di Milano-Bicocca (Italy)
Jun S. Lee, Univ. of Massachusetts, Lowell (United States)


Published in SPIE Proceedings Vol. 8036:
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

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