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Proceedings Paper

Fast virtual shadow projection system as part of a virtual multisensor assistance system
Author(s): Klaus Haskamp; Markus Kästner; Eduard Reithmeier
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Paper Abstract

The quality test is one of the main components of a production process. The main task of the quality test is the inspection of the relevant geometry parts concerning the predefined tolerance range. To verify, that the relevant geometry parts can be detected with a measurement uncertainty, which is less than the predefined tolerance range, multiple measurements of an appropriate reference specimen have to be done. The related time and money effort is very high and can be reduced using a numerical simulation of the whole measurement process. The measurement uncertainty can be estimated using a virtual measurement process and Monte-Carlo methods. Using the combination of the simulation and Monte-Carlo methods, it is, for example, possible, to calculate the optimal alignment of the workpiece within the measurement volume. Thereby, the optimality criterion can be defined as a minimum of the measurement uncertainty or as a hollistic measurement. In addition to the estimation of uncertainties, it is possible to use the virtual measurement system as part of an assistance system. The assistance system should provide measurement strategies with respect to different criteria, like the minimisation of the measurement uncertainty. This is the field of research of the subproject B5 of the collaborative research centre 489 (CRC 489), funded by the German Research Foundation (DFG). The main task is the setup of a virtual multisensor assistance system for the calculation of optimised work piece adapted measurement strategies. In this paper the virtual measurement system and process of a shadow projection system will be explained in detail. Besides the mathematical model, a verification of the simulation and a concept for the estimation of measurement uncertainties will be given.

Paper Details

Date Published: 23 May 2011
PDF: 9 pages
Proc. SPIE 8083, Modeling Aspects in Optical Metrology III, 80830G (23 May 2011); doi: 10.1117/12.883026
Show Author Affiliations
Klaus Haskamp, Leibniz Univ. Hannover (Germany)
Markus Kästner, Leibniz Univ. Hannover (Germany)
Eduard Reithmeier, Leibniz Univ. Hannover (Germany)

Published in SPIE Proceedings Vol. 8083:
Modeling Aspects in Optical Metrology III
Bernd Bodermann, Editor(s)

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