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Proceedings Paper

Application of an end-to-end linear mode photon-counting (LMPC) model to noiseless-gain HgCdTe APDs
Author(s): Anthony Gleckler; Robert Strittmatter; Aldo Apponi; Adam Wade; Jeff Beck; Richard E. Scritchfield; William Sullivan
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Paper Abstract

Linear-Mode Photon Counting (LMPC) detection requires a combined system consisting of a semiconductor avalanche photodiode (APD), a high-gain low-noise amplifier, and a comparator circuit. Modeling these aspects of the system requires a combination of semiconductor detector theory, electronics circuit modeling, and classic decision theory. Because of the disparate skills involved, it is difficult to both model and build such devices. In this paper, we present an end-to-end model of the LMPC detector that contains all the required theory. As part of the decision theory aspect of LMPC technology, we present a three-dimensional Receiver Optimization Characteristic (ROC) curve that contains the key performance aspects of the LMPC as a function of the comparator threshold setting. We present nomenclature and specification methods that provide for unambiguous definitions of the combined-system detector performance for both the fabricators and users of LMPC technology. Finally, we apply the model to a noiseless-gain HgCdTe APD, ROIC, and comparator device being developed by DRS and GEOST in order to demonstrate the photon counting end result, as well as several key intermediate values in the signal chain.

Paper Details

Date Published: 13 May 2011
PDF: 15 pages
Proc. SPIE 8033, Advanced Photon Counting Techniques V, 80330O (13 May 2011); doi: 10.1117/12.882994
Show Author Affiliations
Anthony Gleckler, GEOST, Inc. (United States)
Robert Strittmatter, GEOST, Inc. (United States)
Aldo Apponi, GEOST, Inc. (United States)
Adam Wade, GEOST, Inc. (United States)
Jeff Beck, DRS RSTA, Inc. (United States)
Richard E. Scritchfield, DRS RSTA, Inc. (United States)
William Sullivan, DRS RSTA, Inc. (United States)


Published in SPIE Proceedings Vol. 8033:
Advanced Photon Counting Techniques V
Mark A. Itzler; Joe C. Campbell, Editor(s)

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