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Proceedings Paper

A compact, fast, wide-field imaging spectrometer system
Author(s): Pantazis Mouroulis; Byron E. Van Gorp; Victor E. White; Jason M. Mumolo; Daniel Hebert; Martin Feldman
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Paper Abstract

We present test results from a compact, fast (F/1.4) imaging spectrometer system with a 33° field of view, operating in the 450-1650 nm wavelength region with an extended response InGaAs detector array. The system incorporates a simple two-mirror telescope and a steeply concave bilinear groove diffraction grating made with gray scale x-ray lithography techniques. High degree of spectral and spatial uniformity (97%) is achieved.

Paper Details

Date Published: 12 May 2011
PDF: 12 pages
Proc. SPIE 8032, Next-Generation Spectroscopic Technologies IV, 80320U (12 May 2011); doi: 10.1117/12.882706
Show Author Affiliations
Pantazis Mouroulis, Jet Propulsion Lab. (United States)
Byron E. Van Gorp, Jet Propulsion Lab. (United States)
Victor E. White, Jet Propulsion Lab. (United States)
Jason M. Mumolo, Jet Propulsion Lab. (United States)
Daniel Hebert, Louisiana State Univ. (United States)
Martin Feldman, Louisiana State Univ. (United States)


Published in SPIE Proceedings Vol. 8032:
Next-Generation Spectroscopic Technologies IV
Mark A. Druy; Richard A. Crocombe, Editor(s)

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