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Proceedings Paper

Artefacts for optical surface measurement
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Paper Abstract

Flexible manufacturing technologies are supporting the routine production of components with freeform surfaces in a wide variety of materials and surface finishes. Such surfaces may be exploited for both aesthetic and performance criteria for a wide range of industries, for example automotive, aircraft, small consumer goods and medial components. In order to ensure conformance between manufactured part and digital design it is necessary to understand, validate and promote best practice of the available measurement technologies. Similar, but currently less quantifiable, measurement requirements also exist in heritage, museum and fine art recording where objects can be individually hand crafted to extremely fine levels of detail. Optical 3D measurement systems designed for close range applications are typified by one or more illumination sources projecting a spot, line or structured light pattern onto a surface or surfaces of interest. Reflections from the projected light are detected in one or more imaging devices and measurements made concerning the location, intensity and optionally colour of the image. Coordinates of locations on the surface may be computed either directly from an understanding of the illumination and imaging geometry or indirectly through analysis of the spatial frequencies of the projected pattern. Regardless of sensing configuration some independent means is necessary to ensure that measurement capability will meet the requirements of a given level of object recording and is consistent for variations in surface properties and structure. As technologies mature, guidelines for best practice are emerging, most prominent at the current time being the German VDI/VDE 2634 and ISO/DIS 10360-8 guidelines. This considers state of the art capabilities for independent validation of optical non-contact measurement systems suited to the close range measurement of table top sized manufactured or crafted objects.

Paper Details

Date Published: 21 June 2011
PDF: 10 pages
Proc. SPIE 8085, Videometrics, Range Imaging, and Applications XI, 80850C (21 June 2011); doi: 10.1117/12.882702
Show Author Affiliations
Stuart Robson, Univ. College London (United Kingdom)
J.-Angelo Beraldin, National Research Council Canada (Canada)
Andrew Brownhill, Univ. College London (United Kingdom)
Lindsay MacDonald, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 8085:
Videometrics, Range Imaging, and Applications XI
Fabio Remondino; Mark R. Shortis, Editor(s)

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