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Proceedings Paper

Growth and characterization of ZnO nanostructures for UV sensor applications
Author(s): Ashok K. Sood; E. James Egerton; Yash R. Puri; John Zeller; Tariq Manzur; Dennis L. Polla; Nibir K. Dhar; Jun Zhou; Sheng Xu; Su Zhang; Zhong L. Wang; A. F. Mehdi Anwar
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Paper Abstract

E-O Sensors are being developed for a variety of Military Systems Applications. These include UV, Visible, SWIR, MWIR and LWIR Nano Sensors. In this paper, we will discuss growth and characterization of ZnO Nanowires on a variety of substrates that include Silicon, ZnO and flexible substrates. The critical technologies being developed include ZnO nanostructures with wide band gap for UV detection for a variety of threat warning applications. We will present experimental results on the structural, electrical and optical properties of ZnO nanowire for UV detectors. Experimental results on ZnO based nanostructures demonstrate enhanced UV sensitivity and path forward for larger arrays.

Paper Details

Date Published: 11 March 2011
PDF: 10 pages
Proc. SPIE 7940, Oxide-based Materials and Devices II, 79400Z (11 March 2011); doi: 10.1117/12.882583
Show Author Affiliations
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
E. James Egerton, Magnolia Optical Technologies, Inc. (United States)
Yash R. Puri, Magnolia Optical Technologies, Inc. (United States)
John Zeller, Naval Undersea Warfare Ctr. (United States)
Tariq Manzur, Naval Undersea Warfare Ctr. (United States)
Dennis L. Polla, Defense Advanced Research Projects Agency (United States)
Nibir K. Dhar, Defense Advanced Research Projects Agency (United States)
Jun Zhou, Georgia Institute of Technology (United States)
Sheng Xu, Georgia Institute of Technology (United States)
Su Zhang, Georgia Institute of Technology (United States)
Zhong L. Wang, Georgia Institute of Technology (United States)
A. F. Mehdi Anwar, Univ. of Connecticut (United States)


Published in SPIE Proceedings Vol. 7940:
Oxide-based Materials and Devices II
Ferechteh Hosseini Teherani; David C. Look; David J. Rogers, Editor(s)

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