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Proceedings Paper

Surface plasmon dispersive spectroscopy of thin films at terahertz frequencies
Author(s): A. K. Nikitin; O. V. Khitrov; A. P. Kyrianov; B. A. Knyazev; G. N. Zhizhin
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Paper Abstract

A number of surface plasmon (SP) techniques and devices for terahertz (THz) dispersive spectroscopy of thin films have been developed and reviewed. The techniques are based on the strong dependence of SP complex refractive index κ on the transition layer optical constants. Three of the mentioned techniques employ interference in parallel or quasi parallel beams of bulk and (or) surface waves. These three are remarkable for their accuracy and enable investigators to determine both (real and imaginary) parts of κ in one measuring procedure. Some devices implementing the techniques are static and can have measuring time equal to one pulse duration. Besides, two noninterferometric techniques intended for determining only the real part of κ and assuming tunable monochromatic THz sources are described.

Paper Details

Date Published: 25 November 2010
PDF: 11 pages
Proc. SPIE 7376, Laser Applications in Life Sciences, 73760U (25 November 2010); doi: 10.1117/12.882403
Show Author Affiliations
A. K. Nikitin, Scientific and Technological Ctr. for Unique Instrumentation (Russian Federation)
O. V. Khitrov, Scientific and Technological Ctr. for Unique Instrumentation (Russian Federation)
A. P. Kyrianov, Scientific and Technological Ctr. for Unique Instrumentation (Russian Federation)
B. A. Knyazev, Budker Institute of Nuclear Physics (Russian Federation)
Novosibirsk State Univ. (Russian Federation)
G. N. Zhizhin, Scientific Technological Ctr. of Unique Instruments (Russian Federation)


Published in SPIE Proceedings Vol. 7376:
Laser Applications in Life Sciences
Matti Kinnunen; Risto Myllylä, Editor(s)

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