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Proceedings Paper

Spectral signal processing for tiny optical pieces
Author(s): Aurelian Ovidius I. Trufasu; Georgeta Sorohan; Danut Ursu; Cristina Liliana Trufasu
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Paper Abstract

Spectral system (acronym SPECTECH) is designed to meet the following basics: a) to assure measuring tiny optical single lens in a standard configuration; b) configured for reflected or transmitted beam light; c) configured by user off line to monitor manufacturing or mounting optical components; d) to be flexible to be equipped with more than one spectral detector. Initially, it is equipped with two spectral detectors, but in short time to be able to use more than two. e) configured as process spectrophotometer (continuously) to monitor manufacturing or mounting optical components; f) to be updated or upgraded to meet other necessities. SPECTECH system is a modular one, allowing spectral determinations in a wide range of spectrum (385-1100 nm) and with two detectors UV-VIS (190-1100) and NIR (1000-1700nm) the domain can be wider, covering spectrum from 190 to 1700 nm. Keywords: spectral signal, spectrometry.

Paper Details

Date Published: 4 December 2010
PDF: 6 pages
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782108 (4 December 2010); doi: 10.1117/12.882159
Show Author Affiliations
Aurelian Ovidius I. Trufasu, Politehnica Univ. of Bucharest (Romania)
Georgeta Sorohan, Pro Optica S.A. (Romania)
Danut Ursu, Pro Optica S.A. (Romania)
Cristina Liliana Trufasu, Edmond Nicolau College (Romania)


Published in SPIE Proceedings Vol. 7821:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V
Paul Schiopu; George Caruntu, Editor(s)

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