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Proceedings Paper

Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials
Author(s): Petre C. Logofatu; Cristian Udrea; Valentin Ion; Nicu Doinel Scărişoreanu; Raluca Műller
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Paper Abstract

Ellipsometry is a convenient means to ascertain electro-optic properties, and the null-type methods are particularly so because they do not require a powermeter. Electro-optic materials like Strontium Barium Niobate (SBN) with the symmetry axis normal or parallel to the surface are materials suitable for thin film integrated optic devices, therefore of practical interest. For this reason we endeavoured to devise and to test experimental arrangements that measure the birefringence of uniaxial structures with the symmetry axis parallel and perpendicular to the surface.

Paper Details

Date Published: 4 December 2010
PDF: 7 pages
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782114 (4 December 2010); doi: 10.1117/12.882140
Show Author Affiliations
Petre C. Logofatu, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Cristian Udrea, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Valentin Ion, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Nicu Doinel Scărişoreanu, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Raluca Műller, IMT-Bucharest (Romania)


Published in SPIE Proceedings Vol. 7821:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V
Paul Schiopu; George Caruntu, Editor(s)

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