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Proceedings Paper

Cloning of microstructures due to irradiation of thin gold foil by femtosecond laser radiation
Author(s): B. N. Mironov; S. A. Aseyev; S. V. Chekalin
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Paper Abstract

The analysis of the possibilities of microstructuring (micromachining) of various solids by sharply focused femtosecond laser (fsl) capable of providing for a high intensity for moderate pulse energies remains quite topical. Usually the process takes place immediately at the focal spot and an extended structure can only be formed by scanning the sample. In our experiments focusing fsl pulses into a vacuum setup we produced extended microstructures (microdamages) on a few tens nm thickness gold foil deposited onto a fused-quartz substrate. The structure length has been an order of magnitude larger than the typical size of the irradiated region. The detection of Au+ photoions ensured a highly-sensitivite on-line diagnostics of this phenomenon and in the limit can be used for the probing of the picostructuring of solids irradiated by a laser. In the next step we are "cloning" the microstructure (microdamage) from one surface to another when there is a few tens microns vacuum-spacing between them and only one surface with a metal film is "directly" irradiated by fsl pulses. For the expertiment we prepared two similar fused-quartz prisms and pressed one sample to another. The clearance is determined by the thickness of a spacer (Cu-foil). The possible explanations are given.

Paper Details

Date Published: 8 February 2011
PDF: 7 pages
Proc. SPIE 7994, LAT 2010: International Conference on Lasers, Applications, and Technologies, 79940R (8 February 2011); doi: 10.1117/12.880200
Show Author Affiliations
B. N. Mironov, Institute of Spectroscopy (Russian Federation)
S. A. Aseyev, Institute of Spectroscopy (Russian Federation)
S. V. Chekalin, Institute of Spectroscopy (Russian Federation)


Published in SPIE Proceedings Vol. 7994:
LAT 2010: International Conference on Lasers, Applications, and Technologies
Vladislav Panchenko; Gérard Mourou; Aleksei M. Zheltikov, Editor(s)

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