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Proceedings Paper

Science, technology, and application of THz air photonics
Author(s): X. F. Lu; B. Clough; I.-C. Ho; G. Kaur; J. Liu; N. Karpowicz; J. M. Dai; X.-C. Zhang
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Paper Abstract

The significant scientific and technological potential of terahertz (THz) wave sensing and imaging has been attracted considerable attention within many fields of research. However, the development of remote, broadband THz wave sensing technology is lagging behind the compelling needs that exist in the areas of astronomy, global environmental monitoring, and homeland security. This is due to the challenge posed by high absorption of ambient moisture in the THz range. Although various time-domain THz detection techniques have recently been demonstrated, the requirement for an on-site bias or forward collection of the optical signal inevitably prohibits their applications for remote sensing. The objective of this paper is to report updated THz air-plasma technology to meet this great challenge of remote sensing. A focused optical pulse (mJ pulse energy and femtosecond pulse duration) in gas creates a plasma, which can serve to generate intense, broadband, and directional THz waves in the far field.

Paper Details

Date Published: 5 November 2010
PDF: 14 pages
Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 785406 (5 November 2010); doi: 10.1117/12.880062
Show Author Affiliations
X. F. Lu, Rensselaer Polytechnic Institute (United States)
B. Clough, Rensselaer Polytechnic Institute (United States)
I.-C. Ho, Rensselaer Polytechnic Institute (United States)
G. Kaur, Rensselaer Polytechnic Institute (United States)
J. Liu, Rensselaer Polytechnic Institute (United States)
N. Karpowicz, Rensselaer Polytechnic Institute (United States)
J. M. Dai, Rensselaer Polytechnic Institute (United States)
X.-C. Zhang, Rensselaer Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 7854:
Infrared, Millimeter Wave, and Terahertz Technologies
Cunlin Zhang; Xi-Cheng Zhang; Peter H. Siegel; Li He; Sheng-Cai Shi, Editor(s)

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