Share Email Print
cover

Proceedings Paper

Scanner matching using pupil intensity control between scanners in 30nm DRAM device
Author(s): Jongwon Jang; Daejin Park; Jeaseung Choi; Areum Jung; Gyun Yoo; Jungchan Kim; Cheol-kyun Kim; Donggyu Yim; Junwei Lu; Seunghoon Park; Zongchang Yu; Venu Vellanki; Wenkin Shao; Chris Park
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Scanner mismatch has become one of the critical issues in high volume memory production. There are several components that contribute to the scanner CD mismatch. One of the major components is illumination pupil difference between scanners. Because of acceleration of dimensional shrinking in memory devices, the CD mismatch became more critical in electrical performance and process window. In this work, we demonstrated computational lithography model based scanner matching for sub 3x nm memory devices. We used ASML XT:1900Gi as a reference scanner and ASML NXT:1950i as the to-be-matched scanner. Wafer metrology data and scanner specific parameters are used to build a computational model, and determine the optimal settings by model simulation to minimize the CD difference between scanners. Nano Geometry Research (NGR) was used as a wafer CD metrology tool for both model calibration and matching result verification. The extracted pupil parameters from measured source map from both before and after matching are inspected and analyzed. Simulated and measured process window changes by applying the matching sub-recipe are also evaluated.

Paper Details

Date Published: 22 March 2011
PDF: 11 pages
Proc. SPIE 7973, Optical Microlithography XXIV, 79730S (22 March 2011); doi: 10.1117/12.879570
Show Author Affiliations
Jongwon Jang, Hynix Semiconductor Inc. (Korea, Republic of)
Daejin Park, Hynix Semiconductor Inc. (Korea, Republic of)
Jeaseung Choi, Hynix Semiconductor Inc. (Korea, Republic of)
Areum Jung, Hynix Semiconductor Inc. (Korea, Republic of)
Gyun Yoo, Hynix Semiconductor Inc. (Korea, Republic of)
Jungchan Kim, Hynix Semiconductor Inc. (Korea, Republic of)
Cheol-kyun Kim, Hynix Semiconductor Inc. (Korea, Republic of)
Donggyu Yim, Hynix Semiconductor Inc. (Korea, Republic of)
Junwei Lu, Brion Technologies, Inc. (United States)
Seunghoon Park, Brion Technologies, Inc. (United States)
Zongchang Yu, Brion Technologies, Inc. (United States)
Venu Vellanki, Brion Technologies, Inc. (United States)
Wenkin Shao, Brion Technologies, Inc. (United States)
Chris Park, ASML (Korea, Republic of)


Published in SPIE Proceedings Vol. 7973:
Optical Microlithography XXIV
Mircea V. Dusa, Editor(s)

© SPIE. Terms of Use
Back to Top