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Proceedings Paper

Cross-sectional scanning tunneling microscopy for complex oxide interfaces
Author(s): TeYu Chien; Nathan P. Guisinger; John W. Freeland
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Paper Abstract

Cross-sectional scanning tunneling microscopy (XSTM) is developed for studying the interfaces of the complex oxide heterostructures. Since most of the complex oxide materials have a perovskite structure, which does not have cleavage plane, it posed an experimental challenge for utilizing STM on the fractured surfaces. A well-controlled method for fracturing non-cleavable materials was developed by using the common subtrate: Nb-doped SrTiO3 (Nb:STO). Through systematically studies on the control of the fracturing conditions, on the tip-sample interactions and on the resulting fractured surfaces of Nb:STO, atomic flat terraces are routinely created and stable measurements are achieved. By harnessing the well-controlled fracturing method and the well-controlled tip conditions to a thin film system, La2/3Ca1/3MnO3/Nb:STO (LCMO/Nb:STO), XSTM as well as the ability of cross-sectional scanning tunneling spectroscopy (XSTS) directly revealed the band diagram mapping across the interface. The novel developed, well-controlled XSTM/S for the interfaces of complex oxide heterostructures opened a door for accurate determination of local electronic properties across and at the interface.

Paper Details

Date Published: 15 March 2011
PDF: 8 pages
Proc. SPIE 7940, Oxide-based Materials and Devices II, 79400T (15 March 2011); doi: 10.1117/12.879329
Show Author Affiliations
TeYu Chien, Argonne National Lab. (United States)
Nathan P. Guisinger, Argonne National Lab. (United States)
John W. Freeland, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 7940:
Oxide-based Materials and Devices II
Ferechteh Hosseini Teherani; David C. Look; David J. Rogers, Editor(s)

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