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Proceedings Paper

Partial least squares-preconditioned importance sampling for fast circuit yield estimation
Author(s): Yu Ben; Costas J. Spanos
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Paper Abstract

We propose a partial least squares (PLS)-preconditioned importance sampling method for yield estimation. The method makes use of the rotating vector obtained through PLS regression, and finds the boundary point along the vector by line search. A biased distribution is constructed around that point for subsequent importance sampling simulation. This method is shown to be much more stable and efficient than existing approaches and is validated via an SRAM example.

Paper Details

Date Published: 4 April 2011
PDF: 12 pages
Proc. SPIE 7974, Design for Manufacturability through Design-Process Integration V, 79740P (4 April 2011); doi: 10.1117/12.878725
Show Author Affiliations
Yu Ben, Univ. of California, Berkeley (United States)
Costas J. Spanos, Univ. of California, Berkeley (United States)


Published in SPIE Proceedings Vol. 7974:
Design for Manufacturability through Design-Process Integration V
Michael L. Rieger, Editor(s)

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