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Proceedings Paper

Quantification of temporal resolution and its reliability in the context of TRI-PICCS and dual source CT
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Paper Abstract

Temporal resolution is an important issue especially in cardiac CT. To quantify it, often merely the time that is needed to acquire rawdata that contribute to a reconstructed image is used. In combination with more complex reconstruction algorithms, which aim to improve the temporal resolution, (e.g. TRI-PICCS) this procedure has proven to be inadequate. This study proposes and evaluates a more accurate simulation-based technique to assess the temporal resolution of a CT system (including its reconstruction algorithm). To calculate the temporal resolution of the system on a single point within the field of measurement, a vessel which performs a cardiac motion pattern is simulated at this position. The motion pattern is adapted such that the accuracy loss caused by motion exactly meets a defined threshold and then the temporal resolution can be taken from that motion pattern. Additionally the dependency of the temporal resolution on the direction of the motion is evaluated to obtain a measure of the reliability. The method is applied to single source and dual source full scan and short scan reconstructions as well as on TRI-PICCS reconstructions. The results give an accurate impression on the system response to motion. In conclusion, the proposed method allows quantifying the temporal resolution of a CT system as a function of many parameters (motion direction, source position, object position, reconstruction algorithm).

Paper Details

Date Published: 16 March 2011
PDF: 7 pages
Proc. SPIE 7961, Medical Imaging 2011: Physics of Medical Imaging, 79611M (16 March 2011); doi: 10.1117/12.877976
Show Author Affiliations
Clemens Maaß, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
Marc Kachelrieß, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)


Published in SPIE Proceedings Vol. 7961:
Medical Imaging 2011: Physics of Medical Imaging
Norbert J. Pelc; Ehsan Samei; Robert M. Nishikawa, Editor(s)

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