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Proceedings Paper

Design and fabrication of single grain TFTs and lateral photodiodes for low dose x-ray detection
Author(s): A. Arslan; R. Ishihara; J. Derakhshandeh; C. I. M. Beenakker
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Paper Abstract

Design, fabrication and measurement results of single grain (SG) lateral PIN photodiodes and SG thin film transistors (TFT) are reported in this paper. Devices were developed to be used in indirect X-ray image sensor pixel design. We have controlled position of 6 μm x 6 μm silicon grains with excimer-laser crystallization of a-Si film. Lateral PIN photodiode (PD) arrays were designed inside the single grain with 1 μm, 1.5 μm and 2 μm intrinsic region length and 4 μm width. The gate length and the width of the fabricated TFTs are 1.5 μm and 4 μm, respectively. Devices were fabricated using a-Si, SOI and crystalline silicon layers and electrical measurement results were compared. 100 μm x 100 μm sizes SG-photodiodes have dark and saturation currents on the order of 0.1 nA and 10 nA resulting in a light sensitivity of 200 with an exposure of white light. Fabricated NMOS and PMOS TFTs inside the grains have field effect mobility of 526 cm2/Vs and 253 cm2/Vs, respectively.

Paper Details

Date Published: 16 March 2011
PDF: 8 pages
Proc. SPIE 7961, Medical Imaging 2011: Physics of Medical Imaging, 79614N (16 March 2011); doi: 10.1117/12.877959
Show Author Affiliations
A. Arslan, Delft Univ. of Technology (Netherlands)
R. Ishihara, Delft Univ. of Technology (Netherlands)
J. Derakhshandeh, Delft Univ. of Technology (Netherlands)
C. I. M. Beenakker, Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 7961:
Medical Imaging 2011: Physics of Medical Imaging
Norbert J. Pelc; Ehsan Samei; Robert M. Nishikawa, Editor(s)

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