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Proceedings Paper

Optimized biasing of pump laser diodes in a highly reliable metrology source for long-duration space missions
Author(s): Ilya Y. Poberezhskiy; Daniel H. Chang; Hernan Erlig
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Paper Abstract

Optical metrology system reliability during a prolonged space mission is often limited by the reliability of pump laser diodes. We developed a metrology laser pump module architecture that meets NASA SIM Lite instrument optical power and reliability requirements by combining the outputs of multiple single-mode pump diodes in a low-loss, high port count fiber coupler. We describe Monte-Carlo simulations used to calculate the reliability of the laser pump module and introduce a combined laser farm aging parameter that serves as a load-sharing optimization metric. Employing these tools, we select pump module architecture, operating conditions, biasing approach and perform parameter sensitivity studies to investigate the robustness of the obtained solution.

Paper Details

Date Published: 21 February 2011
PDF: 11 pages
Proc. SPIE 7918, High-Power Diode Laser Technology and Applications IX, 791807 (21 February 2011); doi: 10.1117/12.877605
Show Author Affiliations
Ilya Y. Poberezhskiy, Jet Propulsion Lab. (United States)
Daniel H. Chang, Jet Propulsion Lab. (United States)
Hernan Erlig, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 7918:
High-Power Diode Laser Technology and Applications IX
Mark S. Zediker, Editor(s)

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