Share Email Print
cover

Proceedings Paper

High-performance intensity slope correction method for global process variability band improvement and printability enhancement in RET applications
Author(s): Sergiy M. Komirenko
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A qualitatively new method applicable for process variability band (PVband) improvement and printability enhancement in resolution enhancement technique (RET) applications is reported. The method does not use costly simulations through the process window (PW). Instead, it utilizes a unique feedback mechanism derived from the intensity distribution information available during nominal optical proximity correction (OPC) simulation. Consequently, this Intensity Slope Correction (ISC) method provides superior performance as compared to traditional process window aware OPC tools. Preliminary results are presented. They suggest that this method can successfully be applied for improvement of integral PVband throughout the entire layout leading to global printability optimization.

Paper Details

Date Published: 22 March 2011
PDF: 6 pages
Proc. SPIE 7973, Optical Microlithography XXIV, 797318 (22 March 2011); doi: 10.1117/12.877594
Show Author Affiliations
Sergiy M. Komirenko, Mentor Graphics Corp. (United States)


Published in SPIE Proceedings Vol. 7973:
Optical Microlithography XXIV
Mircea V. Dusa, Editor(s)

© SPIE. Terms of Use
Back to Top