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Proceedings Paper

Beam coherence and x-ray windows
Author(s): Ali Khounsary; Barry Lai; Jun Qian; Ruben Khachatryan; Jozef Maj; Xianrong Huang
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Paper Abstract

Beryllium windows are used on many X-ray synchrotron beamlines to separate and protect the ultra-high vacuum of the storage ring from the experimental environment. Currently, such a window is typically made of a thin, high-purity, beryllium foil, which may or may not have been polished. It is well known that these windows affect the transmitted beam quality. The impact ranges from non-perceptible to profound, depending on the experiment. The degradation of the X-ray beam is of increasing importance and concern, however, and in fact a number of beamlines now are run windowless or with a very small and thin silicon nitride window. There remain many instances where a large and robust window is desirable or necessary, and it is for this reason that developing windows that have little or no impact on the transmitted X-ray beam quality is important. This presentation reports on the progress in developing single-crystal beryllium X-ray windows. Due to its high purity and homogeneity, relative structural perfection, and high polishiblity single-crystal beryllium is an attractive window material candidate, particularly for beamlines conducting imaging or coherence-based experiments. Development of thin and uniform windows with less than 1 nm rms surface roughness and their preliminary characterization results are presented.

Paper Details

Date Published: 6 October 2010
PDF: 5 pages
Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 78020O (6 October 2010); doi: 10.1117/12.877449
Show Author Affiliations
Ali Khounsary, Argonne National Lab. (United States)
Barry Lai, Argonne National Lab. (United States)
Jun Qian, Argonne National Lab. (United States)
Ruben Khachatryan, Argonne National Lab. (United States)
Jozef Maj, Argonne National Lab. (United States)
Xianrong Huang, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 7802:
Advances in X-Ray/EUV Optics and Components V
Shunji Goto; Ali M. Khounsary; Christian Morawe, Editor(s)

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