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Proceedings Paper

Time-resolved x-ray scattering
Author(s): Daniel Schick; Clemens von Korff Schmising; André Bojahr; Mareike Kiel; Peter Gaal; Matias Bargheer
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Paper Abstract

Ultrafast x-ray diffraction (UXRD) has become more and more prevalent in various scientific disciplines that are interested in directly observing atomic motion in real time. The timescale, amplitude and phase of collective atomic motion can be determined with high accuracy, even when the induced amplitude is smaller than thermal fluctuations. The structural rearrangements induced by an ultrafast stimulus (charge carriers excitation or heat deposition by a laser pulse) can be recorded in real time. Here we report on a new laser-driven plasma-x-ray source (PXS) and discuss different applications which will be addressed in UXRD experiments.

Paper Details

Date Published: 21 February 2011
PDF: 10 pages
Proc. SPIE 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV, 793715 (21 February 2011); doi: 10.1117/12.877147
Show Author Affiliations
Daniel Schick, Univ. Potsdam (Germany)
Clemens von Korff Schmising, Lund Univ. (Sweden)
André Bojahr, Univ. Potsdam (Germany)
Mareike Kiel, Univ. Potsdam (Germany)
Peter Gaal, Univ. Potsdam (Germany)
Matias Bargheer, Univ. Potsdam (Germany)


Published in SPIE Proceedings Vol. 7937:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV
Kong-Thon Tsen; Jin-Joo Song; Markus Betz; Abdulhakem Y. Elezzabi, Editor(s)

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