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Proceedings Paper

Separating true range measurements from multi-path and scattering interference in commercial range cameras
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Paper Abstract

Time-of-flight range cameras acquire a three-dimensional image of a scene simultaneously for all pixels from a single viewing location. Attempts to use range cameras for metrology applications have been hampered by the multi-path problem, which causes range distortions when stray light interferes with the range measurement in a given pixel. Correcting multi-path distortions by post-processing the three-dimensional measurement data has been investigated, but enjoys limited success because the interference is highly scene dependent. An alternative approach based on separating the strongest and weaker sources of light returned to each pixel, prior to range decoding, is more successful, but has only been demonstrated on custom built range cameras, and has not been suitable for general metrology applications. In this paper we demonstrate an algorithm applied to both the Mesa Imaging SR-4000 and Canesta Inc. XZ-422 Demonstrator unmodified off-the-shelf range cameras. Additional raw images are acquired and processed using an optimization approach, rather than relying on the processing provided by the manufacturer, to determine the individual component returns in each pixel. Substantial improvements in accuracy are observed, especially in the darker regions of the scene.

Paper Details

Date Published: 27 January 2011
PDF: 10 pages
Proc. SPIE 7864, Three-Dimensional Imaging, Interaction, and Measurement, 786404 (27 January 2011); doi: 10.1117/12.876586
Show Author Affiliations
A. A. Dorrington, The Univ. of Waikato (New Zealand)
J. P. Godbaz, The Univ. of Waikato (New Zealand)
M. J. Cree, The Univ. of Waikato (New Zealand)
A. D. Payne, The Univ. of Waikato (New Zealand)
L. V. Streeter, The Univ. of Waikato (New Zealand)


Published in SPIE Proceedings Vol. 7864:
Three-Dimensional Imaging, Interaction, and Measurement
J. Angelo Beraldin; Geraldine S. Cheok; Michael B. McCarthy; Ulrich Neuschaefer-Rube; Ian E. McDowall; Margaret Dolinsky; Atilla M. Baskurt, Editor(s)

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